English, Article edition: ANALYSIS OF VOLTAGE SIGNALS BY FLICKER NOISE METHODOLOGY APPLIED ON POROUS SILICON FILMS GROWTH ARTURO RAMIREZ-PORRAS

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Bookmark: http://trove.nla.gov.au/version/84956
Physical Description
  • article
Language
  • English

Edition details

Title
  • ANALYSIS OF VOLTAGE SIGNALS BY FLICKER NOISE METHODOLOGY APPLIED ON POROUS SILICON FILMS GROWTH
Author
  • ARTURO RAMIREZ-PORRAS
Physical Description
  • article
Notes
  • The Flicker Noise Analysis methodology is applied on voltage signals recorded when the electrochemical etching of crystalline surfaces of silicon is performed. The porous silicon material resulting from this procedure is composed of nanocrystals possessing remarkable properties which can be employed in the development of optical, electronic, or biological sensor devices. As a result of the analysis, two dynamic processes during the electrochemical reaction have been identified: one related to the dissolution of the crystalline matrix and the other related to the porous morphology itself.
  • Porous silicon, data processing, noise analysis
  • RePEc:wsi:srlxxx:v:15:y:2008:i:05:p:613-617
Language
  • English
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